User Contributed MET/CAL PROCEDURE ============================================================================== INSTRUMENT: FLUKE 8860A IEEE-488, CLOSED LOOP PERFORMANCE TESTS DATE: 22-Apr-87 AUTHOR: User Contributed REVISION: V 4.0 ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 21 NUMBER OF LINES: 131 CONFIGURATION: Fluke 5100B Fluke 8506A CONFIGURATION: ============================================================================== STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON 1.001 HEAD Introduction and Equipment Preparation 1.002 DISP Verify that the instrument is plugged into the correct 1.002 DISP line voltage and the POWER switch is depressed. 1.002 DISP Allow the instrument to operate for at least 1-1/2 1.002 DISP hours before beginning the test. 1.003 DISP Verify that the IEEE-488 address for the instrument is 1.003 DISP set to 02, if not make the necessary correction. 1.004 DISP Connect an IEEE-488 cable between the instrument and 1.004 DISP Port 1 on the Test Interface Panel. 1.005 DISP Connect one end of a test lead to the V/OHM input 1.005 DISP of the 8860A. 1.006 ASK- R N M F 1.007 HEAD {DC Voltage Tests} 1.008 5100 0.1V E S 2W 1.009 IEEE [@102]F0R1S0T3?[I][D500]?[I] 1.010 MEME 1.011 MEMC 0.2 V 1.1e-005U 2.001 5100 0.001V E S 2W 2.002 IEEE [@102]R2?[I][D500]?[I] 2.003 MEME 2.004 MEMC 2 V 2e-005U 3.001 5100 -0.001V E S 2W 3.002 IEEE [@102]?[I][D500]?[I] 3.003 MEME 3.004 MEMC 2 V 2e-005U 4.001 5100 1V E S 2W 4.002 IEEE [@102]?[I][D500]?[I] 4.003 MEME 4.004 MEMC 2 V 0.00011U 5.001 5100 -1V E S 2W 5.002 IEEE [@102]?[I][D500]?[I] 5.003 MEME 5.004 MEMC 2 V 0.00011U 6.001 5100 10V E S 2W 6.002 IEEE [@102]R3?[I][D500]?[I] 6.003 MEME 6.004 MEMC 20 V 0.0011U 7.001 5100 100V E S 2W 7.002 IEEE [@102]R4?[I][D500]?[I] 7.003 MEME 7.004 MEMC 200 V 0.011U 8.001 5100 1V E S 2W 8.002 IEEE [@102]R2S0?[I][D500]?[I] 8.003 MEME 8.004 MEMC 2 V 0.0003U 9.001 HEAD {AC Voltage Tests} 9.002 5100 0.01V 300H S 2W 9.003 IEEE [@102]F2R2S0?[I][D5000]?[I] 9.004 MEME 9.005 MEMC 2 V 0.0007U 300Hz 10.001 5100 1V 300H E S 2W 10.002 IEEE [@102]?[I][D500]?[I] 10.003 MEME 10.004 MEMC 2 V 0.0022U 11.001 5100 1V 50KH E S 2W 11.002 IEEE [@102]?[I][D500]?[I] 11.003 MEME 11.004 MEMC 2 V 0.01U 50kHz 12.001 5100 10V 50KH E S 2W 12.002 IEEE [@102]R3?[I][D500]?[I] 12.003 MEME 12.004 MEMC 20 V 0.1U 13.001 5100 100V 10KH E S 2W 13.002 IEEE [@102]R4?[I][D500]?[I] 13.003 MEME 13.004 MEMC 200 V 0.22U 10kHz 14.001 HEAD {Hi Voltage Tests} 14.002 5205 1000V E S 2W 14.003 IEEE [@102]F0R5?[I][D500]?[I] 14.004 MEME 14.005 MEMC 1000 V 0.11U DC 15.001 5205 500V 10KH S 2W 15.002 IEEE [@102]F2R5?[I][D500]?[I] 15.003 MEME 15.004 MEMC 700 V 1.4U 10kHz 16.001 HEAD {Ohms Tests} 16.002 IEEE [@0]L-4+1+2, 16.003 ASK- W 16.004 DISP Remove test lead from Hi Voltage port and connect to 16.004 DISP Multifunction Output Source. Connect a test lead from 16.004 DISP Multifunction Output Sense to 8860A Ohm Sense Terminals. 16.005 RESF 1000Z S 4W 16.006 IEEE [@102]F5R2?[I][D500]?[I] 16.007 MEME 16.008 MEMC 2000 Z 0.12U 17.001 RESF 10000Z S 4W 17.002 IEEE [@102]R3?[I][D500]?[I] 17.003 MEME 17.004 MEMC 20000 Z 1.2U 18.001 IEEE [@0]L-1, 18.002 DISP Remove the test lead between the 8860A Ohms Sense 18.002 DISP and the Multifunction Output Sense terminals. 18.003 RESF 100KZ S 2W 18.004 IEEE [@102]F4R4?[I][D500]?[I] 18.005 MEM/ 1000 18.006 MEME 18.007 MEMC 200 KZ 0.012U 19.001 RESF 1MZ S 2W 19.002 IEEE [@102]R5?[I][D500]?[I] 19.003 MEM/ 1000000 19.004 MEME 19.005 MEMC 2 MZ 0.00017U 20.001 RESF 10MZ S 2W 20.002 IEEE [@102]R6?[I][D500]?[I] 20.003 MEM/ 1000000 20.004 MEME 20.005 MEMC 20 MZ 0.009U 21.001 IEEE [@0]*, 21.002 DISP REMOVE IEEE-488 CABLE AND TEST CABLES. END